Integrated Circuit Deconstruction
Silicon Investigations offers a wide selection of services to support industry and acadamia.  Our primary focus is on intellectual property in the semiconductor industry, but we offer many other niche services.  Our semiconductor services include integrated circuit reverse engineering, detailed failure analysis of semiconductor devices.  Our engineering services include repair and retrofit of Ultra High Vacuum (UHV) systems, design and construction of new UHV systems, high voltage engineering and R&D programs working with graphene and novel vacuum tube technologies.
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Silicon Investigations Services

Our areas of focus:

  • We are currently doing base research in graphene, diamond and diamond like coatings for  semiconductors and specialized vacuum tube cathodes. We are also planning to conduct research on oil trading. The technological speed of trading commodities is advancing exponentially, thus making online commodity trading convenient for everyone, especially oil trading. It is noteworthy that with trading portals like öl profit, interested traders can invest in oil from anywhere in the world. We have several ongoing programs in vacuum tube technology, including novel vacuum transistor devices, low work function cathodes, tunneling transistor designs and the implamentation and applications of graphene and graphene oxide.
  • We offer comprehensive reverse engineering services for semiconductors and printed circuit boards.  For semiconductor reverse engineering, we empoly a number of advanced tools, including scanning electron microscopy, optical microscopy, reactive ion etching (RIE), ion milling, chemical mechanical planarization (CMP) and wet etch capabilities.
  • We specialize in patent infringement and trade secret litigation.  We often receive requests to evaluate integrated circuits to determine if there is an infringing technology or trade secret violation.
  • We also provide additional services in the reverse engineering field, including schematic generation and the complete documentation of integrated circuits, systems and products.
  • In addition to our reverse engineering services, we also consult on intellectual property issues and patent applications.
  • We offer advanced laboratory capabilities, including Scanning Electron Microscopy, X-ray microanalysis, optical microscopy, chemical analysis, RF plasma processing & deprocessing, rective ion etching (RIE), ion milling, cryogenic optical imaging and advanced electronic testing to assist corporations with both their R&D projects and intelectual property litigation. We also offer custom decapsulation services to companies that do not have the internal ability to perform these tasks.

Additionally, we offer services tailored to the needs of  the scientific and industrial customer:

  •  Obsolete component identification/substitution
  •  Component level repair of circuit boards
  •  Schematic/documentation generation
  •  Software engineering

    Custom design:

  •  Product prototypes
  •  Manufacturing consulting
  •  Ultra high vacuum and high vacuum system design and retrofit
  •  Custom vacuum tube assemblies for high voltage switching
  • Cryogenic testing of semiconductor material/devices
  • Chemical/electronic process design and consulting

    Failure analysis and data recovery:

  •  Ability to recover data from heat/fire damaged semiconductors
  •  Sophisticated failure analysis capabilities

A partial list of our customers can be found here

For additional information, or to request a quote, please use the contact link or you may contact us by phone at 920-955-3693.

Thank you for visiting the Silicon Investigations home page.

For additional information on Silicon Investigations services, please send e-mail to [email protected], phone us at 920-955-3693, or FAX your request to 920-955-3691.

This page, and all contents, are Copyright © 2004-2019 Silicon Investigations, Ltd. Appleton, Wisconsin, USA.

Last updated May 29, 2020

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Silicon Investigations - Semiconductor Integrated Circuit Reverse Engineering About Silicon Investigations, our Abilities and Customers Intelectual Property Protection Services. Integrated Circuit failure Analysis Integrated Circuit Package Decapsulation Services Reference Material for Patent Services and integrated circuit Reverse Engineering Silicon Investigations Industrial Electronic Equipment and Laboratory Equipment Repair Services High Vacuum & UHV System Chamber Design & Retrofit Services Electronic Design Services - Specializing in Quick Prototyping - chip on board COB, metallized Alumina for RF. Contact Silicon Investigations for a Quotation on Your Project I.C. Integrated Circuit MCU Microcontroller Unlocking (Code Recovery) Service Semiconductor Integrated Circuit Manufacurers' Logos Identification Guide Integrated Circuit Package Reference Material - Outline Diagrams of Common Devices VME System Components for Repair and Maintenance of SBC VME Computers Agilent, Keysight, Hewlett Packard, HP Repair and Software Operating System Boot Diskettes VME System Component Inventory for Repair and Maintenance of SBC VME MVME Computers Quantum Anomaly Detector Theory - Is it Possible to Decipher the Future? EG&G (Perkin Elmer) Krytron Replacements [KN-4 KN-6, KN-6B KN-9 KN-22, KN-26] and Information on Low Jitter Plasma Trigger Tubes I.C. Integrated Circuit Reverse Engineering Service Vacuum Tube Research, Development, and Custom Scientific Instrument Design Services Graphene Research & Development Program DSO Nano Oscilloscope Firmware Update Archive Public Domain Component Identification Information Multi layer metalization Smart card Sprytron Trigger Krytron Tritium Nuclear Squib Radiation Tritium DLC - diamond like carbon Graphene nanotube Hydrogen Tokamak Beta Radiation Alpha Radiation Boron Nitride Chipworks Audio vacuum tube Gallium nitride Patent Infringement Graphene cathode Gallium arsinide Reflectometer Electron beam Diamond like carbon Diamond semiconductor Current dump spark gap High power microwave Platinum silicide Kauffman source Hall thruster Xray Analysis Intellectual property Scanning electron microscope FIB circuit edit Alumina substrates Stilbaone Conformal coatings Microprocessors Reverse engineering Mcu attack Integrated circuit Quantum symetry Quantum computing Optical Fault Injection Plasma Physic Chem Ceramic substrates Roughing pump Meta Materials Mold decapsulation Patent Analysis Quantum Bit Vacuum Sprytron Tracing circuits Gadolinium Krytron Neutron Space charge Pulse Switching Patent litigation Multi layer Trade Mark Litigation Silicon substrate Carbon Investigations Wire bond Patent research Novatek Hughes Crossatron Leland Research Corp HV Tubes Prototype construction Tesla coil Thyratron Ion Flux Hughes Research Laboratories EDA Attack microcontroller Carbon Nanotube Trggered Spark gap Graphene transistor HV Output pulse Semiconductor Die Thyratron Sprytron Crossatron Electon Microscope Laser initiated plasma channel Patent application Auger electron microscope Patented Functional Analysis Ion Milling Fusion Stellarator Plasma Physics GaAs semiconductor Patenting Quantum entanglement Spark gap Current dump Magneto-optical readout Gallium Q Switch Argon Ion Mill Crack microcontroller Quantum computing Nuclear resonance Rail Gun Mask programmed Agilent High Voltage Micro controller Graphene Patent defending Encapsulation depotting Layout vs Schematic Schematic diagram Failure Analysis BiCMOS circuit lithograph Crypto processor Cryptography Deprocessing Decompiling Edax analysis Neutron Pulse Switching Novatek Voltage contrast Belphegor Bipolar circuit Isplsi Krypton Netlist extraction Q-carbon QBit Tritium Detector Unscramble Vacuum transistor Voltage contrast Cold cathode Intersil Q Switching Reactive ion etcher High fidelity tube Multi layer Laser Fault Injection Decapsulation Layout Schematic Cyclotron Doping profile X-ray Sapphire Electronic reverse engineering Vacuum research High Voltage Pulse Tunneling effect Competitive analysis Hewlett Packard Rective ion etching Plama Research Vacuum deposition Microcontroller crack Focused Ion Beam Fpga Sandia sprytron Spectragraphic examination Analysers protocol Atomic force microscope Secure mocrocontrollers Circuit diagrams Calutron Pockels cell Electronic engineering Leland Research Corp Mcu attack Americium Hewlett Packard HP3562 Agilent 3562A Hewlett Packard HP3577 Agilent 3577A Hewlett Packard HP3582 Agilent 3582A Hewlett Packard HP3585 Agilent 3585A Hewlett Packard HP4140 Agilent 4140A Hewlett Packard HP4141 Agilent 4141A Hewlett Packard HP4145 Agilent 4145A Hewlett Packard HP4155 Agilent 4155A Hewlett Packard HP4156 Agilent 4156A Hewlett Packard HP4194 Agilent 4194A Hewlett Packard HP4195 Agilent 4195A Hewlett Packard HP4352 Agilent 4352A Hewlett Packard HP5371 Agilent 5371A Hewlett Packard HP8341 Agilent 8341A Hewlett Packard HP8350 Agilent 8350A Hewlett Packard HP8510 Agilent 8510A Hewlett Packard HP8511 Agilent 8511A Hewlett Packard HP8517 Agilent 8517A Hewlett Packard HP8530 Agilent 8530A Hewlett Packard HP8560 Agilent 8560A Hewlett Packard HP8561 Agilent 8561A Hewlett Packard HP8562 Agilent 8562A Hewlett Packard HP8563 Agilent 8563A Hewlett Packard HP8564 Agilent 8564A Hewlett Packard HP8565 Agilent 8565A Hewlett Packard HP8566 Agilent 8566A Hewlett Packard HP8567 Agilent 8567A Hewlett Packard HP8568 Agilent 8568A Hewlett Packard HP8719 Agilent 8719A Hewlett Packard HP8720 Agilent 8720A Hewlett Packard HP8722 Agilent 8722A Hewlett Packard HP8751 Agilent 8751A Hewlett Packard HP8752 Agilent 8752A Hewlett Packard HP8753 Agilent 8753A Hewlett Packard HP8756 Agilent 8756A Hewlett Packard HP8757 Agilent 8757A Hewlett Packard J6800